• DocumentCode
    531725
  • Title

    Main noise influence of the RIN laser diode of an EML transmitter used in an UWB RoF link

  • Author

    Algani, Catherine ; Billabert, Anne-Laure ; Deshours, Frédérique ; Chettat, Hichem ; Rumelhard, Christian ; Blache, Fabrice ; Alquié, Georges

  • Author_Institution
    CNAM, ESYCOM, Paris, France
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    The use of precise large signal models for optoelectronic devices, such as laser diode, electro-absorption modulator, optical fiber and photodiode, is useful to simulate and to predict the performances of an optical fiber link. Moreover, to characterize its dynamic range and this last influence on a high data rate digital signal, it is necessary to develop not only nonlinear models, but also noisy models taking into account both electrical and optical operating of the devices. This paper presents the simulation results of an optical fiber link on which the optical signal is externally modulated by an UWB OFDM signal. Simulations are performed using co-simulation on ADS system simulator Ptolemy. The envelope simulator is used at the circuit level thanks to the developed large signal electrical models of the E/O and O/E devices. These simulations highlight the greater influence of the RIN of the laser diode, compared to the other additive noise sources on the optical link. In some cases, this influence could affect significantly the RoF system performances, particularly in case of a low-level input power UWB signal and of UWB multi-channels use.
  • Keywords
    OFDM modulation; optical links; photodiodes; radio-over-fibre; semiconductor lasers; ultra wideband communication; ADS system simulator; EML transmitter; Ptolemy; RIN laser diode; UWB OFDM signal; UWB RoF link; additive noise sources; electro-absorption modulator; large signal electrical models; noise influence; nonlinear models; optical fiber link; optical link; optical signal; optoelectronic devices; photodiode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616729