• DocumentCode
    531728
  • Title

    An analysis of performance degradation of a memoryless DPD due to frequency response of an envelope amplifier in an EER Power Amplifier

  • Author

    Funahashi, Yuuki ; Kato, Takayuki ; Tango, Toshihiro ; Yamaoka, Atsushi ; Yamaguchi, Keiichi ; Tanabe, Yasuhiko

  • Author_Institution
    Corp. R&D Center, Toshiba Corp., Kawasaki, Japan
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    723
  • Lastpage
    726
  • Abstract
    Dynamic supply voltage techniques, such as an EER (Envelope Elimination and Restoration) PA (Power Amplifier), have attracted significant attention recently due to their high power efficiency under back-off operation. EER PAs generally possess strong nonlinearity compared to a conventional PAs, memoryless DPD (Digital Predistortor) is therefore indispensable for maintain signal quality. However, the level of residual distortion compensation with a memoryless DPD of a two tone test is dependent on the tone spacing. In this paper, we identify that the frequency response of an envelope amplifier causes a significant degradation to the performance of a combined memoryless DPD and EER PA. A simple and useful model is proposed for the analysis of this degradation. Furthermore, we demonstrate that IMD3 (third-order intermodulation distortion) for a two tone test separation between 100 kHz and 4 MHz is improvement by up to 25dB by the memoryless DPD with a frequency response compensation envelope amplifier.
  • Keywords
    compensation; frequency response; intermodulation distortion; memoryless systems; power amplifiers; EER power amplifier; IMD3; back-off operation; digital predistortor; dynamic supply voltage techniques; envelope elimination and restoration; frequency response compensation envelope amplifier; high power efficiency; memoryless DPD; performance degradation; residual distortion compensation; signal quality; third-order intermodulation distortion; tone spacing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616733