• DocumentCode
    531729
  • Title

    A tuneable probe for noncontacting microwave measurements

  • Author

    Yhland, K. ; Stenarson, J. ; Andersson, K.

  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    775
  • Lastpage
    778
  • Abstract
    This paper describes an electrically tuneable loop coupler and its use for noncontacting measurements in microstrip circuits. Earlier loop coupler probes have the disadvantage of needing mechanical tuning to give sufficient directivity for scalar measurements on substrates having different dielectric constants. This problem is overcome through the use of a PIN diode as an adjustable termination on one of the coupler ports. The probe is evaluated for microstrip substrates with an εr ranging from 2:33 to 10 with transmission line characteristic impedances ranging from 30Ω to 80Ω. After tuning, the coupler shows a directivity better than 20 dB up to 3:8 GHz for εr = 2:33 and up to 1 GHz for εr = 10.
  • Keywords
    circuit tuning; microstrip circuits; p-i-n diodes; permittivity; PIN diode; dielectric constant; electrically tuneable loop coupler; mechanical tuning; microstrip circuit; microstrip substrate; noncontacting microwave measurement; scalar measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616736