DocumentCode
531729
Title
A tuneable probe for noncontacting microwave measurements
Author
Yhland, K. ; Stenarson, J. ; Andersson, K.
fYear
2010
fDate
28-30 Sept. 2010
Firstpage
775
Lastpage
778
Abstract
This paper describes an electrically tuneable loop coupler and its use for noncontacting measurements in microstrip circuits. Earlier loop coupler probes have the disadvantage of needing mechanical tuning to give sufficient directivity for scalar measurements on substrates having different dielectric constants. This problem is overcome through the use of a PIN diode as an adjustable termination on one of the coupler ports. The probe is evaluated for microstrip substrates with an εr ranging from 2:33 to 10 with transmission line characteristic impedances ranging from 30Ω to 80Ω. After tuning, the coupler shows a directivity better than 20 dB up to 3:8 GHz for εr = 2:33 and up to 1 GHz for εr = 10.
Keywords
circuit tuning; microstrip circuits; p-i-n diodes; permittivity; PIN diode; dielectric constant; electrically tuneable loop coupler; mechanical tuning; microstrip circuit; microstrip substrate; noncontacting microwave measurement; scalar measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2010 European
Conference_Location
Paris
Print_ISBN
978-1-4244-7232-1
Type
conf
Filename
5616736
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