Title :
A 45-nm SOI CMOS Integrate-and-Dump Optical Sampling Receiver
Author :
Gathman, Timothy D. ; Buckwalter, James F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
Abstract :
An integrate-and-dump receiver based on an active feedback integrator is demonstrated in a 45-nm SOI CMOS process. The integrate-and-dump receiver provides matched filtering for non-return-to-zero, return-to-zero, and pulse amplitude modulation digital modulation formats, resulting in high SINAD as well as inherent anti-aliasing/low-pass filtering for a 2 GS/s high linearity/high-dynamic-range optical sampling receiver. The measured SINAD is greater than 28 dBc with a sinusoidal input up to 1 GHz; the SNR is greater than 29 dBc. The 2-GS/s integrate-and-dump receiver consumes less than 100 mW. The chip area is 0.980×0.762 mm2 including the pads.
Keywords :
CMOS integrated circuits; amplitude modulation; low-pass filters; matched filters; optical modulation; optical receivers; quadrature amplitude modulation; silicon-on-insulator; QAM; SINAD; SOI CMOS process; active feedback integrator; antialiasing; integrate-and-dump optical sampling receiver; low-pass filtering; matched filtering; nonreturn-to-zero digital modulation formats; pulse amplitude modulation digital modulation formats; return-to-zero digital modulation formats; signal-to-noise-and-distortion ratio; Bandwidth; Gain; Impedance; Optical receivers; Signal to noise ratio; Analog processing circuits; high speed integrated circuits; optical interconnects; optical receiver; sampled data circuits;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2012.2215797