Title :
Simulation and analysis of the diode characteristics based on Mulitisim and Excel
Author :
Jiang, Youyong ; Ding, Mingming
Author_Institution :
Dept. of Mech. & Electr. Eng., Zhejiang Water Conservancy & Hydropower Collage, Hangzhou, China
Abstract :
Multisim and Excel software is been used at the same time in the research of the diode characteristic. It has been shown while searching for on the China National Knowledge Infrastructure (CNKI) that the same research results does not appear. The Multisim software is been used to carry on simulation on the diode characteristic testing, the Excel software is been used to fit and show the volt-ampere characteristic curve and resistance characteristic curve. This way is more convenient and swifter than the traditional object electric circuit, this way is more accurate and more intuitive than the traditional hand-drawn curve. Through the study on simulation data and fitting curve, the understanding of the diode characteristic is been strengthened.
Keywords :
circuit analysis computing; semiconductor device testing; semiconductor diodes; China national knowledge infrastructure; Excel software; Multisim software; diode characteristic simulation; diode characteristic testing; fitting curve; hand-drawn curve; object electric circuit; resistance characteristic curve; simulation data; volt-ampere characteristic curve; Analytical models; Potentiometers; RNA; Resistance; Excel; Multisim; fitting curve; originality; test simulation;
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
DOI :
10.1109/ICCASM.2010.5620380