Title :
Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy
Author :
Kannari, Fumihiko ; Matsuishi, Keiichiro ; Harada, Takuya ; Ohi, Jun ; Oishi, Yu
Author_Institution :
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
Abstract :
We apply two nova methods, a spectral interferometry with NSOM, and fringe-resolved-autocorrelation with dark-field microscopy in the spatio-temporal characterization of femtosecond localized plasmon at metal nanostructures. Spatio-temporal plasmon control is studied using these diagnostics.
Keywords :
high-speed optical techniques; light interferometry; nanostructured materials; near-field scanning optical microscopy; optical microscopy; plasmonics; spatiotemporal phenomena; SNOM; dark-field microscopy; femtosecond localized plasmon; fringe-resolved autocorrelation; spatio-temporal plasmon control; spectral interferometry; Decision support systems;
Conference_Titel :
Optical Communication (ECOC), 2010 36th European Conference and Exhibition on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-8536-9
Electronic_ISBN :
978-1-4244-8534-5
DOI :
10.1109/ECOC.2010.5621113
