• DocumentCode
    53313
  • Title

    Computation of the Real Controllability Radius and Minimum-Norm Perturbations of Higher-Order, Descriptor, and Time-Delay LTI Systems

  • Author

    Lam, Stanley ; Davison, Edward J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • Volume
    59
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    2189
  • Lastpage
    2195
  • Abstract
    A linear time-invariant (LTI) system´s controllability radius measures the norm of the smallest parametric perturbation such that the perturbed system is uncontrollable, and is of practical importance. In this note, we study the real controllability radii of i) higher-order systems; ii) descriptor systems; and iii) time-delay systems, where the perturbations are restricted to the set of real values, and the spectral norm is considered. Formulas for these radii are presented using a framework involving generalized real perturbation values, which has certain computational advantages over other formulations found in the literature. In particular, the formulas are readily more computable, especially for higher-dimensional systems, and a minimum-norm perturbation can also easily be obtained. Numerical examples are presented.
  • Keywords
    controllability; delay systems; linear systems; multidimensional systems; perturbation techniques; LTI system controllability; descriptor system; generalized real perturbation values; higher-dimensional systems; higher-order system; linear time-invariant system controllability; minimum-norm perturbations; parametric perturbation; perturbed system; real controllability radius; time-delay LTI systems; time-delay systems; Bismuth; Controllability; Mathematical model; Null space; Optimization; Uncertainty; Controllability radius; descriptor linear time-invariant (LTI) systems; higher-order LTI systems; time-delay LTI systems;
  • fLanguage
    English
  • Journal_Title
    Automatic Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9286
  • Type

    jour

  • DOI
    10.1109/TAC.2014.2298991
  • Filename
    6705617