Title :
Analog circuit module level fault diagnosis
Author :
Yao, Lu-Feng ; Wang, Jian-Zhong ; Zhang, Chun-Xian
Author_Institution :
Coll. of Sci., Navy Eng. Univ., Wuhan, China
Abstract :
An approach of feature extraction for analog circuit fault diagnosis is proposed based on the single module soft failure model. Making use of the approach, the single module fault feature extracted can not only be used to distinguish single module circuit fault effectively, but also be applied to the various modules electric circuit of single fault and faults of circumstance. The simulation is carried out where the sample electric circuit outputs is processed to get the fault catalog and the results show that the extracted feature can be used to locate the position of multi-modules fault circuit fault accurately.
Keywords :
analogue circuits; fault simulation; analog circuit module level; fault diagnosis; multimodule fault circuit fault; single module fault feature; single module soft failure model; Analog circuits; Circuit faults; Computational modeling; Fault diagnosis; Feature extraction; Integrated circuit modeling; Time domain analysis; Fault diagnosis; Features; Soft failure; analog circuit;
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
DOI :
10.1109/ICCASM.2010.5623138