DocumentCode :
533280
Title :
System level analysis and experimental characterization of frequency pulling in PLLs
Author :
Ranaivoniarivo, Manohiaina ; Wane, Sidina ; Philippe, Pascal ; Aymard, Olivier ; Gamand, Patrice
Author_Institution :
NXP Semicond., Caen, France
fYear :
2010
fDate :
23-25 Sept. 2010
Firstpage :
370
Lastpage :
374
Abstract :
In this paper a system-level experimental characterization and analysis of pulling in phase-locked-loops (PLL) is presented. Competitive effects originating from integrated IC (chip-level) through the PLL loop and the power amplifier (PA) are investigated taking into account coupling with SAW filter on PCB-level. Physical interpretation of observed pulling effects which result from combined influences of PLL loop, PA block and SAW filter module are proposed to sustain a global behavioral modeling using Matlab Simulink facilities, and Cadence Verilog-AMS tooling.
Keywords :
phase locked loops; power amplifiers; printed circuits; surface acoustic wave filters; Cadence Verilog-AMS tooling; Matlab Simulink; PCB-level; PLL; SAW filter module; chip-level; frequency pulling; integrated IC; phase-locked-loops; power amplifier; system level analysis; Charge pumps; Phase locked loops; Power amplifiers; Power generation; SAW filters; Transfer functions; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software, Telecommunications and Computer Networks (SoftCOM), 2010 International Conference on
Conference_Location :
Split, Dubrovnik
Print_ISBN :
978-1-4244-8663-2
Electronic_ISBN :
978-953-290-004-0
Type :
conf
Filename :
5623631
Link To Document :
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