• DocumentCode
    533340
  • Title

    Triggering of transient latch-up (TLU) by system level ESD

  • Author

    Brodbeck, Tilo ; Stadler, Wolfgang ; Baumann, Christian ; Esmark, Kai ; Domanski, Krzysztof

  • Author_Institution
    ETS DIR SVQ, Infineon Technol. AG, Munich, Germany
  • fYear
    2010
  • fDate
    3-8 Oct. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper investigates the influences of the temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more critical parameter than transient trigger parameters. For high discharge currents which are typical for system level surges as e.g. cable discharge events, even very short trigger pulses can cause TLU.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; integrated circuit testing; IC latch-up test; cable discharge events; discharge currents; system level ESD; transient latch-up; transient trigger parameters; Clamps; Electrostatic discharge; Generators; Power supplies; Stress; Thyristors; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
  • Conference_Location
    Reno, NV
  • Print_ISBN
    978-1-58537-182-2
  • Electronic_ISBN
    978-1-58537-182-2
  • Type

    conf

  • Filename
    5623707
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=533340