Title :
Measurement, simulation and reduction of EOS damage by electrical fast transients on AC power
Author :
Wallash, Al ; Kraz, Vladimir
Author_Institution :
Hitachi Global Storage Technol., San Jose, CA, USA
Abstract :
It is shown that electrical fast transients (EFT) on the AC power line can result in electrical overstress (EOS) damage to a Class 0 ESD sensitive device connected to the output of AC powered equipment. A methodology for measuring EFT and EOS transients is described and simulations are used to understand coupling mechanisms. Finally, several techniques for reduction of the EOS transient are tested and analyzed.
Keywords :
electrostatic discharge; power cables; transient analysis; AC power line; AC powered equipment; EOS damage measurement; EOS transient reduction; class 0 ESD sensitive device; coupling mechanisms; electrical fast transients; electrical overstress damage; Current measurement; Earth Observing System; Electrostatic discharge; Probes; Transient analysis; Voltage measurement;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
