Title :
An ESD design automation framework and tool flow for nano-scale CMOS technologies
Author :
Muhammad, Mujahid ; Gauthier, Robert ; Li, Junjun ; Ginawi, Ahmed ; Montstream, James ; Mitra, Souvick ; Chatty, Kiran ; Joshi, Amol ; Henderson, Karen ; Palmer, Nicholas ; Hulse, Brian
Author_Institution :
IBM, Essex Junction, VT, USA
Abstract :
We present a successfully implemented ESD design automation framework that evaluates and verifies the ESD protection methodology at all stages of a standard integrated circuit design flow. The tools used at each step of the flow and sample results showing excellent correlation to hardware test data is presented.
Keywords :
CMOS integrated circuits; electrostatic discharge; ESD design automation framework; ESD protection methodology; nanoscale CMOS technologies; standard integrated circuit design flow; tool flow; Clamps; Discharges; Electrostatic discharge; Integrated circuit modeling; Integrated circuit synthesis; Layout; Resistance;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
