DocumentCode :
533352
Title :
Impact of the power supply on the ESD system level robustness
Author :
Giraldo, Sandra ; Salaméro, Christophe ; Caignet, Fabrice
Author_Institution :
ON Semicond., Toulouse, France
fYear :
2010
fDate :
3-8 Oct. 2010
Firstpage :
1
Lastpage :
8
Abstract :
This work presents the case study of the response of an audio amplifier IC stressed while powered up. Under these conditions, the discharge current path varies from that in the unpowered circuit. Complete simulations have been performed and compared to measurements to highlight the IC´s failure under system ESD stress conditions.
Keywords :
analogue integrated circuits; audio-frequency amplifiers; electrostatic discharge; failure analysis; power supply circuits; ESD system level robustness; IC failure; audio amplifier IC; power supply; unpowered circuit; Capacitance; Current measurement; Discharges; Electrostatic discharge; IEC; Power supplies; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
Type :
conf
Filename :
5623720
Link To Document :
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