Title :
CDM damage due to Automated Handling Equipment
Author :
Millar, Sean ; Smallwood, Jeremy
Author_Institution :
Xilinx Ireland Ltd., Dublin, Ireland
Abstract :
Charged Device Model (CDM) damage caused by Automated Handling Equipment (AHE) to a 65 nm CMOS logic product at an advanced test facility is reported. Careful study and characterization using a commercially available EMI monitoring system revealed significant ESD events. These events were substantially reduced through alternative AHE component selection.
Keywords :
CMOS logic circuits; electromagnetic interference; electrostatic discharge; test facilities; AHE component selection; CDM damage; CMOS logic product; EMI monitoring system; ESD events; advanced test facility; automated handling equipment; charged device model; size 65 nm; Electromagnetic interference; Electrostatic discharge; Materials; Rails; Sensor phenomena and characterization;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
