Title :
Pitfalls for CDM calibration procedures
Author :
Smedes, T. ; Polewski, M. ; van IJzerloo, A. ; Lefebvre, J.L. ; Dekker, M.
Author_Institution :
NXP Semicond., Nijmegen, Netherlands
Abstract :
A product qualification gave very different results for CDM testing between 3 labs. This paper describes the investigation into the root cause of these differences. The most relevant issues are the measurement bandwidth and the quality of the calibration modules. An improved procedure is proposed.
Keywords :
calibration; electrostatic discharge; testing; CDM calibration procedures; CDM testing; calibration module quality; measurement bandwidth; Calibration; Capacitance; Capacitance measurement; Current measurement; Discharges; Oscilloscopes; Standards;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
