DocumentCode
533398
Title
A study on the application of on-chip EOS/ESD full-protection device for TMR heads
Author
Tag-at, Ray Nicanor M ; Li, Lloyd Henry
Author_Institution
SEPZ, Hitachi Global Storage Technol. Philippines Corp., Laguna, Philippines
fYear
2010
fDate
3-8 Oct. 2010
Firstpage
1
Lastpage
8
Abstract
On-chip EOS/ESD full-protection for TMR heads can be achieved using shunt diodes that are mounted permanently in the TMR device. This consists of two semiconductor diodes connected in parallel and in reverse order across the reader pads of TMR heads. This method also increases the ESD threshold of the TMR heads.
Keywords
electrostatic discharge; magnetic sensors; semiconductor diodes; tunnelling magnetoresistance; TMR heads; TMR sensor; on-chip EOS-ESD full-protection device; semiconductor diodes; shunt diodes; Capacitance; Electrostatic discharge; Integrated circuit modeling; SPICE; Schottky diodes; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location
Reno, NV
Print_ISBN
978-1-58537-182-2
Electronic_ISBN
978-1-58537-182-2
Type
conf
Filename
5623770
Link To Document