DocumentCode
533685
Title
Characteristics of application of impulse reflectometry in investigation of ultra-wideband circuits
Author
Berdin, S.A. ; Karelin, S.Y. ; Korenev, V.G. ; Mukhin, V.S. ; Magda, I.I. ; Naboka, A.M. ; Soshenko, V.A.
Author_Institution
Inst. of Plasma Electron. & New Accel. Methods, NSC KhIPT NASU, Kharkov, Ukraine
fYear
2010
fDate
13-17 Sept. 2010
Firstpage
981
Lastpage
983
Abstract
Features of impulse reflectometry of the sub-nanosecond range are considered. The influence of parameters of a probing signal in the ultrabroadband nonuniform systems on the results of measurements is analyzed. An algorithm of processing of measurement data that allows accounting of the shape of the probing signal and numerous reflections, originating from nonuniform systems, is proposed.
Keywords
reflectometry; signal processing; ultra wideband technology; impulse reflectometry; measurement data processing algorithm; signal probing; ultra-wideband circuits; ultrabroadband nonuniform systems; Data processing; Electronic mail; Impedance; Reflection; Reflectometry; Shape; Ultra wideband technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-7184-3
Type
conf
DOI
10.1109/CRMICO.2010.5632411
Filename
5632411
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