Title :
Characteristics of application of impulse reflectometry in investigation of ultra-wideband circuits
Author :
Berdin, S.A. ; Karelin, S.Y. ; Korenev, V.G. ; Mukhin, V.S. ; Magda, I.I. ; Naboka, A.M. ; Soshenko, V.A.
Author_Institution :
Inst. of Plasma Electron. & New Accel. Methods, NSC KhIPT NASU, Kharkov, Ukraine
Abstract :
Features of impulse reflectometry of the sub-nanosecond range are considered. The influence of parameters of a probing signal in the ultrabroadband nonuniform systems on the results of measurements is analyzed. An algorithm of processing of measurement data that allows accounting of the shape of the probing signal and numerous reflections, originating from nonuniform systems, is proposed.
Keywords :
reflectometry; signal processing; ultra wideband technology; impulse reflectometry; measurement data processing algorithm; signal probing; ultra-wideband circuits; ultrabroadband nonuniform systems; Data processing; Electronic mail; Impedance; Reflection; Reflectometry; Shape; Ultra wideband technology;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-7184-3
DOI :
10.1109/CRMICO.2010.5632411
