Title :
Diode damage under action of pulse edge
Author :
Klyuchnik, A.V. ; Solodov, A.V.
Author_Institution :
Moscow Radio-Tech. Inst. of RAS, Moscow, Russia
Abstract :
The estimation of damage of p-n junction on short pulse front is presented.
Keywords :
p-n junctions; semiconductor diodes; diode damage; p-n junction damage; pulse edge; short pulse front; Current density; Electric breakdown; Equations; Estimation; Heating; Nonhomogeneous media; P-n junctions;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-7184-3
DOI :
10.1109/CRMICO.2010.5632430
