• DocumentCode
    533703
  • Title

    Diode damage under action of pulse edge

  • Author

    Klyuchnik, A.V. ; Solodov, A.V.

  • Author_Institution
    Moscow Radio-Tech. Inst. of RAS, Moscow, Russia
  • fYear
    2010
  • fDate
    13-17 Sept. 2010
  • Firstpage
    946
  • Lastpage
    947
  • Abstract
    The estimation of damage of p-n junction on short pulse front is presented.
  • Keywords
    p-n junctions; semiconductor diodes; diode damage; p-n junction damage; pulse edge; short pulse front; Current density; Electric breakdown; Equations; Estimation; Heating; Nonhomogeneous media; P-n junctions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4244-7184-3
  • Type

    conf

  • DOI
    10.1109/CRMICO.2010.5632430
  • Filename
    5632430
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=533703