Title :
Technique and accuracy appraisal of extraction of mHEMT small-signal equivalent circuit
Author :
Kokolov, A.A. ; Savin, A.A. ; Babak, L.I.
Author_Institution :
Tomsk State Univ. of Control Syst., Tomsk, Russia
Abstract :
The new reliable and accurate technique of extraction of small-signal model of microwave FETs is proposed. The influence of measurement errors on accuracy of extracted parameters of mHEMT small-signal model is calculated.
Keywords :
equivalent circuits; field effect MMIC; high electron mobility transistors; extracted parameters; mHEMT small-signal equivalent circuit; measurement errors; microwave FET; small-signal model; Equivalent circuits; Microwave FETs; Microwave circuits; mHEMTs;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-7184-3
DOI :
10.1109/CRMICO.2010.5632521
