DocumentCode
533757
Title
Technique and accuracy appraisal of extraction of mHEMT small-signal equivalent circuit
Author
Kokolov, A.A. ; Savin, A.A. ; Babak, L.I.
Author_Institution
Tomsk State Univ. of Control Syst., Tomsk, Russia
fYear
2010
fDate
13-17 Sept. 2010
Firstpage
210
Lastpage
211
Abstract
The new reliable and accurate technique of extraction of small-signal model of microwave FETs is proposed. The influence of measurement errors on accuracy of extracted parameters of mHEMT small-signal model is calculated.
Keywords
equivalent circuits; field effect MMIC; high electron mobility transistors; extracted parameters; mHEMT small-signal equivalent circuit; measurement errors; microwave FET; small-signal model; Equivalent circuits; Microwave FETs; Microwave circuits; mHEMTs;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-7184-3
Type
conf
DOI
10.1109/CRMICO.2010.5632521
Filename
5632521
Link To Document