• DocumentCode
    533778
  • Title

    Simulation and experimental investigation of coplanar elements for design of MMIC

  • Author

    Dobush, I.M. ; Kokolov, A.A. ; Babak, L.I.

  • Author_Institution
    Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
  • fYear
    2010
  • fDate
    13-17 Sept. 2010
  • Firstpage
    208
  • Lastpage
    209
  • Abstract
    Simulation and measurement results of distributed and lumped elements used in GaAs MMICs with coplanar lines at frequency range up to 50 GHz are presented. Based on these data, an accuracy of models for MMIC coplanar elements has been estimated.
  • Keywords
    III-V semiconductors; MMIC; gallium arsenide; GaAs; GaAs MMIC; MMIC coplanar element; distributed element; lumped element; Frequency measurement; Gallium arsenide; Integrated circuit modeling; MMICs; Microwave circuits; Scattering parameters; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4244-7184-3
  • Type

    conf

  • DOI
    10.1109/CRMICO.2010.5632549
  • Filename
    5632549