Methods of levels detection of harmonic components of transistor oscillators

Using a method of slowly varying amplitudes the calculation of levels of harmonic components of SHF microwaves of the transistor oscillator is carried out. It is shown, that their values are determined not only by elements of the circuit of the generator and amplitude of the basic fluctuation, but also substantially by nonlinearity of the characteristics in the field of a working point. For reduction of levels of harmonic components under adjustment of generators, as a criterion of characteristic nonlinearity estimation, it is offered to use change of size of a constant component of a target current of the transistor in case of influence of SHF signal.