DocumentCode
533987
Title
The new generation of microwave near-field sensors
Author
Gordienko, Yu Ye ; Lepikh, Ya I.
Author_Institution
Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
fYear
2010
fDate
13-17 Sept. 2010
Firstpage
1041
Lastpage
1042
Abstract
The article represents results of investigations and development of new principles of functioning and construction concerning microwave sensors of various physical parameters of materials and objects which have carried out for improvement its metrological characteristics and increasing the sensitivity and localization precision, for the range expansion of controlling parameters and for increasing a number of controlling parameters.
Keywords
microwave materials; microwave measurement; controlling parameters; localization precision; metrological characteristics; microwave near-field sensors; Microscopy; Microwave sensors; Semiconductor device measurement; Sensitivity; Sensor systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-7184-3
Type
conf
DOI
10.1109/CRMICO.2010.5632797
Filename
5632797
Link To Document