• DocumentCode
    534867
  • Title

    The removal of blink and saccade artifact in EEG recordings by Independent Component Analysis

  • Author

    Dong, Jie ; Wang, Tao ; Zhang, Ai-tao ; Dai, Hong-ya

  • Author_Institution
    Sch. of Biomed. Eng., Southern Med. Univ., Guangzhou, China
  • Volume
    3
  • fYear
    2010
  • fDate
    16-18 Oct. 2010
  • Firstpage
    1071
  • Lastpage
    1075
  • Abstract
    Pervasive electroencephalographic (EEG) artifacts are associated with eye movement. This study shows that Independent Component Analysis (ICA) using Joint Approximate Diagonalization of Eigenmatrice (JADE) algorithm can be applied to removing ocular artifacts in EEG. The nine channels of EEGs were recorded from three young healthy subjects with additional VEOG and HEOG channels in blinking and saccade conditions respectively. Seven EEG recordings were selected for artifacts removal tests with two EOG recordings indicating the possible interferences. Ocular artifacts for both conditions were successfully presented by an independent component, which was then eliminated to reconstruct the artifact-free EEGs. This study demonstrates that JADE algorithm can be an effective tool in correcting EOG interference with multichannel EEG recordings.
  • Keywords
    biomechanics; electro-oculography; electroencephalography; independent component analysis; medical signal processing; signal reconstruction; EEG recordings; HEOG; JADE algorithm; VEOG; blink artifact; eigenmatrice; eye movement; independent component analysis; joint approximate diagonalization; ocular artifact removal; pervasive electroencephalographic artifacts; saccade artifact; signal reconstruction; Approximation algorithms; Electrodes; Electroencephalography; Electrooculography; Independent component analysis; Scalp; Surfaces; Electrencepholgram; Independent Component Analysis; Ocular artifacts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Engineering and Informatics (BMEI), 2010 3rd International Conference on
  • Conference_Location
    Yantai
  • Print_ISBN
    978-1-4244-6495-1
  • Type

    conf

  • DOI
    10.1109/BMEI.2010.5640549
  • Filename
    5640549