Title :
Assembly requirements for multi-channel coupling micro-optics in board-level optical interconnects
Author :
Nieweglowski, Krzysztof ; Rieske, Ralf ; Wolter, Klaus-Jilrgen
Author_Institution :
Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
Abstract :
The compatibility to standard surface mount technology (SMT) seems to be the answer for cost-effectiveness that ultimately hinders the competitiveness of board-level optical interconnect technologies compared to their conventional but still evolving electrical counterparts. These short-distance optical links will be most likely employed as parallel high bit-rate busses and hence require multi-channel coupling. A multi-fiber based TIR micro-optic has been presented before. This paper describes the in-depth experimental investigation of all relevant coupling interfaces for an entire optical on-board link. By means of spatial optical loss measurements the maximum allowable misalignments between link components (VCSEL, microoptical coupling elements, integrated waveguides and p-in-photodiode array) are determined. As a result the SMT compatibility with passive alignment could be proven. Following the optical simulations using the ZEMAX® optical design tool are verified with these experimental results. A simplified model of the fiber based coupling element and a source model of the used VCSEL will be presented. The tolerance analysis from the optical modeling is in very good agreement with the experimental data. Additionally, the paper proposes a novel integrated micro-optic that allows for volume manufacturing. The above derived results can be used for designing and optimizing the novel micro-optics.
Keywords :
micro-optics; microassembling; optical fibre couplers; optical interconnections; optical links; optical loss measurement; surface mount technology; SMT compatibility; assembly requirement; board-level optical interconnect technology; fiber based coupling element; micro-optics; multichannel coupling micro-optics; optical design tool; optical modeling; optical on-board link; optical simulation; source model; spatial optical loss measurement; surface mount technology; tolerance analysis; volume manufacturing; Computational modeling; Couplings; Optical coupling; Optical losses; Optical waveguides; Propagation losses; Q measurement;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5642814