DocumentCode :
535113
Title :
Images matching based on edge maps and wavelet transform
Author :
Lee, Mong-Shu ; Chen, Mu-Yen ; Jwo, Dah-Jing
Author_Institution :
Dept. of Comput. Sci. & Eng., Nat. Taiwan Ocean Univ., Keelung, Taiwan
Volume :
3
fYear :
2010
fDate :
16-18 Oct. 2010
Firstpage :
1054
Lastpage :
1058
Abstract :
A structure-based image similarity measurement called DTWT-SSIM is presented. The main idea behind DTWT-SSIM is to combine the shift-invariance advantage of dual-tree wavelet transform (DTWT) with the structure-preserving property of the structural similarity metrics (SSIM). A series of experimental results show the improved measurement to be an effective and stable metric in the comparison of edge maps when small noise and distortion appear in the images.
Keywords :
edge detection; image denoising; image matching; wavelet transforms; DTWT-SSIM; dual-tree wavelet transform; edge maps; image matching; image noise; image similarity measurement; structural similarity metrics; Image edge detection; Indexes; Measurement; Noise; Phase change materials; Wavelet transforms; edge maps; image similarity; wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6513-2
Type :
conf
DOI :
10.1109/CISP.2010.5646920
Filename :
5646920
Link To Document :
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