Title :
Total variation models based algorithm of illumination normalization for face recognition
Author :
Yan, Kai ; Ren, HuoRong ; Yu, Hailong
Author_Institution :
Sch. of Mech. & Electr. Eng., Xidian Univ., Xi´´an, China
Abstract :
This paper proposes a new method for the face illumination normalization, combining Total variation models with Contourlet transform. We iterate the high-frequency information decomposed by the Contourlet transform. Then extract the face illumination normalization by Contourlet Inverse transform. This algorithm takes full advantage of the multidimensional of Contourlet transform and the edge-preserve ability of Total variation models, it can effectively obtain the face illumination normalization for the face recognition. Experiments are carried out upon the Yale B database and the results demonstrate that the proposed method achieves satisfactory recognition rates under varying illumination conditions. Compared with the Contourlet transform method and the traditional total variation models, the proposed method has an average recognition ratio increase 9.6% and 2.55%.
Keywords :
face recognition; lighting; transforms; Yale B database; contourlet inverse transform; contourlet transform; edge-preserve ability; face illumination normalization; face recognition; high-frequency information; total variation models based algorithm; Face; Face recognition; Lighting; Mathematical model; Oscillators; TV; Transforms; Contourlet; face recognition; illumination normalization; total variation models;
Conference_Titel :
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6513-2
DOI :
10.1109/CISP.2010.5647075