Title :
Study on edge subpixel location of ellipse in computer vision measurement
Author :
Baozhang, Li ; Yanping, Cui
Author_Institution :
Sch. of Mech. & Electron. Eng., Hebei Univ. of Sci. & Technol., Shijiazhuang, China
Abstract :
Ellipse is the important element in the computer vision measurement. A spatial moment operator with three gray model is researched. First the LOG operator is used to locate the edge at the level of pixel quickly, and then the spatial moment is used to detect subpixel location of the discrete points of edge. The least square fitting is adopted to fit the ellipse´s subpixel edge points which have been detected by Hough transform. The validity and precision of spatial moment subpixel edge detection and the detection of ellipse on image plane is studied. The experiments show that spatial moment subpixel edge detection and the detection of ellips on image plane have acquired high precision stability.
Keywords :
Hough transforms; computer vision; edge detection; least squares approximations; Hough transform; LOG operator; computer vision measurement; edge subpixel location; ellipse subpixel edge points; gray model; image plane; least square fitting; spatial moment subpixel edge detection; subpixel location detection; Cameras; Equations; Fitting; Image edge detection; Mathematical model; Pixel; Transforms; Edge detection; Ellipse exstract; Hough transform; Least square fitting; Spatial moment;
Conference_Titel :
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6513-2
DOI :
10.1109/CISP.2010.5647739
