Title :
Topography and structure of nanocomposite C-Ni field emitters
Author :
Czerwosz, E. ; Iwanejko, I. ; Kaminska, A. ; Rymarczyk, J. ; Keczkowska, J. ; Suchanska, M. ; Craciunoiu, F. ; Comanescu, F.
Author_Institution :
Tele&Radio Res. Inst., Warsaw, Poland
Abstract :
In this paper we present results of structural and topographical studies of C-Ni nanocomposite films with different Ni content. Films were obtained by PVD method. Their structure was investigated by Raman and FTIR spectroscopy and topography by AFM. Typical field emission current from these films is few μA (up to 10 μA) for 3kV anode-cathode voltage and 0.1mm anode-cathode distance.
Keywords :
Fourier transform spectra; Raman spectra; atomic force microscopy; electron field emission; fullerenes; infrared spectra; nanocomposites; nickel; thin films; AFM; C-Ni; FTIR spectroscopy; PVD method; Raman spectroscopy; anode-cathode distance; anode-cathode voltage; field emitters; nanocomposite films; nanocomposite structure; topography; voltage 3 kV; Films; Laser beams; Measurement by laser beam; Nickel; Surface topography; AFM; FTIR; PVD; Raman; field emission; nanocomposite film;
Conference_Titel :
Semiconductor Conference (CAS), 2010 International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4244-5783-0
DOI :
10.1109/SMICND.2010.5650263
