Title :
Reliability statistics analysis of components using masked series system life data from random censoring test with incomplete information
Author :
Shi, Yi-min ; Zhang, Fan
Author_Institution :
Dept. of Appl. Math., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
This paper discusses reliability statistics analysis of components using masked series-system life data from random censoring test with incomplete information. The maximum likelihood estimators of the unknown parameters included in life time distributions of the individual components and the reliability of components are obtained. Moreover, a numerical simulation example is given. It is shown that the relationship of the given sample size, censoring pattern, masking level, and failure signaling probability and this method can be used to deal with practical problems.
Keywords :
maximum likelihood estimation; numerical analysis; reliability theory; statistical distributions; censoring pattern; failure signaling probability; life time distribution; masked series system life data; masking level; maximum likelihood estimator; numerical simulation; random censoring test; reliability statistics analysis; sample size; Maximum likelihood estimation; Masked data; Maximum likelihood estimation; Random censoring test with incomplete information;
Conference_Titel :
Future Information Technology and Management Engineering (FITME), 2010 International Conference on
Conference_Location :
Changzhou
Print_ISBN :
978-1-4244-9087-5
DOI :
10.1109/FITME.2010.5654849
