Title :
Enhanced batch process monitoring and quality prediction based on multi-phase multi-way partial least squares
Author :
Chen, Xiuzhe ; Gao, Xunjin ; Zhang, Yating ; Qi, Yongsheng
Author_Institution :
Coll. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
Abstract :
For multistage, time-variant, nonlinear characteristic and unavailable on-line product qualities of batch process, a multi-phase Multi-way partial least squares (MP-MPLS) method is proposed. Using ISODATA dynamic clustering algorithm, process data was automatically divided into several operation stages according to relevance. Then, Using recursive DTW algorithm to synchronize these unequal Sub-phase, and sub-phase MPLS models were developed for every phases for on-line monitoring and quality prediction. The proposed method easily handles the following problems: (1) static single model; (2) process and its model do not match; (3) linear method may not be efficient in compressing and extracting nonlinear process data. The idea and algorithm are illustrated with respect to the typical data collected from a benchmark simulation of fed-batch penicillin fermentation production. For comparison purposes, a traditional MPLS model and a knowledge-based MPLS model was established. The results demonstrate the effectiveness of the proposed method.
Keywords :
batch processing (industrial); chemical industry; computerised monitoring; least squares approximations; pattern clustering; process monitoring; quality control; recursive estimation; DTW algorithm; ISODATA; batch process monitoring; dynamic clustering; knowledge based model; multiphase partial least square; multiway partial least squares; online monitoring; penicillin fermentation production; quality prediction; recursive algorithm; Biological system modeling; Biomedical monitoring; Monitoring; Multiprotocol label switching; Trajectory; batch process; component; dynamic time warping; multi-phase; on-line monitoring; quality prediction;
Conference_Titel :
Intelligent Computing and Intelligent Systems (ICIS), 2010 IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6582-8
DOI :
10.1109/ICICISYS.2010.5658834