DocumentCode :
53650
Title :
Effect of Polarization-Matched n-Type AlGaInN Electron-Blocking Layer on the Optoelectronic Properties of Blue InGaN Light-Emitting Diodes
Author :
Yun Li ; You Gao ; Miao He ; Jun Zhou ; Yan Lei ; Li Zhang ; Kebao Zhu ; Yulong Chen
Author_Institution :
Key Lab. of Micro-nano Photonic Functional Mater. & Devices of Guangdong Province, South China Normal Univ., Guangzhou, China
Volume :
9
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
244
Lastpage :
248
Abstract :
A design approach is proposed to improve the performances of blue InGaN light-emitting diodes (LEDs) at high current by using of the polarization-matched n-type AlGaInN electron-blocking layer (EBL) instead of conventional EBLs, owing to the more uniform carrier distribution across the multiply quantum well (MQW) active regions. And the response parameters of the blue InGaN LEDs, such as the radiative recombination rate, the internal quantum efficiency and output power, are calculated by the advanced physical model of semiconductor devices (APSYS) software. The simulation results reveal that the total power and the radiative recombination rates of the blue InGaN LEDs with the n-type AlGaInN EBL have been greatly promoted, and their efficiency droop has also been evidently moderated, compared with that of the LEDs with three types of EBL which are p-type AlGaN EBL, p-type AlGaInN EBL and n-type AlGaN EBL.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; light emitting diodes; polarisation; quantum well devices; semiconductor devices; wide band gap semiconductors; APSYS software; AlGaInN; EBL; MQW active region; blue light-emitting diodes; carrier distribution; efficiency droop; internal quantum efficiency; output power; polarization-matched n-type electron-blocking layer effect; quantum well active region; radiative recombination rate; semiconductor devices software; Aluminum gallium nitride; Leakage current; Light emitting diodes; Radiative recombination; Solid state lighting; Blue InGaN light-emitting diodes (LEDs); advanced physical model of semiconductor devices (APSYS) simulation; polarization-matched electron-blocking layer (EBL);
fLanguage :
English
Journal_Title :
Display Technology, Journal of
Publisher :
ieee
ISSN :
1551-319X
Type :
jour
DOI :
10.1109/JDT.2012.2226206
Filename :
6461101
Link To Document :
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