DocumentCode :
53750
Title :
Mid-Infrared Interband Cascade Photodetectors With Different Absorber Designs
Author :
Zhao-Bing Tian ; Krishna, Sanjay
Author_Institution :
Univ. of New Mexico, Albuquerque, NM, USA
Volume :
51
Issue :
4
fYear :
2015
fDate :
Apr-15
Firstpage :
1
Lastpage :
5
Abstract :
We report an experimental investigation on the influence of absorber thicknesses in mid-infrared interband cascade (IC) photodetectors. The electrical and optical properties of these five-stage IC detectors are characterized in detail over a wide operating temperature range. The IC detectors are operational above 400 K under zero bias, with a 50% cutoff of 4.56 μm and external quantum efficiency (single pass, no antireflection coating) up to 10.1% at room temperature. The dark current in the IC detectors is at 10 μA/cm2 at -10 mV, with a Johnson-limited D* of 1.10 × 1011 Jones at 200 K. Our experimental results show that both the optical response and the noise performance in the quantum-engineered IC detectors improve with increased discrete absorber thicknesses. It is also suggested that the dark current in the IC detectors is determined by tunneling components at lower temperatures, and becomes diffusion-limited at higher temperatures.
Keywords :
infrared detectors; optical design techniques; photodetectors; quantum well devices; Johnson-limited D*; absorber designs; dark current; discrete absorber thicknesses; electrical properties; external quantum efficiency; five-stage IC detectors; mid-infrared interband cascade photodetectors; noise performance; operating temperature; optical properties; optical response; quantum-engineered IC detectors; room temperature; temperature 200 K; temperature 293 K to 298 K; tunneling components; voltage -10 mV; wavelength 4.56 mum; zero bias; Dark current; Detectors; Integrated circuits; Integrated optics; Optical detectors; Photodetectors; Temperature; Mid-infrared; mid-infrared; photodetectors; quantum wells; type-II superlattices;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2015.2398735
Filename :
7031867
Link To Document :
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