DocumentCode
538441
Title
Serial RapidIO robustness enhancement scheme
Author
Zhang, Yong ; Wang, Yong ; Zhang, Ping ; Sun, Kai
Author_Institution
Wireless Technol. Innovation Inst., Beijing Univ. of Posts & Telecommun., Beijing, China
fYear
2010
fDate
25-27 Aug. 2010
Firstpage
1
Lastpage
5
Abstract
Robustness enhancement scheme in Serial RapidIO (SRIO) interconnect is proposed to overcome the performance degradation caused by noise and Electromagnetic Interference (EMI). The main idea of this scheme is the adaptive speed transition and mode conversion. Adaptive speed transition can improve average throughput and reduce delay in high Bit Error Rate (BER) environment. Mode conversion is to conquer frequent usage of feedback channel. Simulation shows that the scheme of combining adaptive speed transition with mode conversion leads great performance enhancement in SRIO network.
Keywords
electromagnetic interference; peripheral interfaces; adaptive speed transition; bit error rate; electromagnetic interference; feedback channel; mode conversion; performance degradation; robustness enhancement scheme; serial rapidIO interconnect; Bit error rate; Conferences; Delay; Receivers; Robustness; Throughput; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications and Networking in China (CHINACOM), 2010 5th International ICST Conference on
Conference_Location
Beijing
Print_ISBN
973-963-9799-97-4
Type
conf
Filename
5684662
Link To Document