Title :
Improving customer responsiveness at assembly test operations with the application of manufacturing science
Author :
Tafoya, Joan ; Gonzalez, Diana Rojas
Author_Institution :
Intel Products Vietnam, Ltd, Ho Chi Minh City, Vietnam
Abstract :
Through a disciplined approach of building awareness for the importance of cycle time improvement, providing the organization with knowledge on how to improve factory performance and then taking action on that knowledge, Intel´s Assembly Test Manufacturing (ATM) division reduced cycle time by 35–70% in less than 1 year for key products. This paper will share how ATM made these incredible improvements in such a short time period by introducing manufacturing science and Factory Physics® concepts and rigorously applying them throughout the 9 factory network. The results demonstrate the significant progress ATM has made in improving the effectiveness of our manufacturing by using Factory Physics® (FP) concepts rather then relying on intuition.
Keywords :
Assembly; Asynchronous transfer mode; Equations; Physics; Production facilities; Throughput;
Conference_Titel :
Semiconductor Manufacturing (ISSM), 2008 International Symposium on
Conference_Location :
Tokyo, Japan
Electronic_ISBN :
1523-553X