DocumentCode :
539399
Title :
Comprehensive plug and play FD system realized Predictive Maintenance
Author :
Sakai, Katsuhisa ; Tsuchiyama, Hirofumi ; Kawai, Ryosei ; Tabaru, Tetsuya ; Kurosawa, Takashi
Author_Institution :
Renesas Technology Corp., 751 Horiguchi, Hitachinaka-shi, Ibaraki-ken, 312-8504, Japan
fYear :
2008
fDate :
27-29 Oct. 2008
Firstpage :
273
Lastpage :
276
Abstract :
This paper presents a comprehensive plug & play Fault Detection (FD) system that can be easily deployed fab-wide. By collaborating with Equipment supplier (ES) and Fault Detection and Classification (FDC) supplier, we have established FD models that can monitor each component of equipment comprehensively. The FD models convert recipe dependent parameters into independent ones defined by using set-point values and trigger variables obtained from the components. Since the FD models can continuously monitor tools regardless to recipe variation, it is suitable for applications of high-mix fab where various recipes are running in a tool. Applications of these models to Cu-CMP process enabled us to avoid unscheduled maintenances (UM) by predicting appropriate timing of Predictive Maintenance (PdM) and reduce up to 35% of scrapped wafers.
Keywords :
Asia; Data models; Monitoring; Plugs; Process control; Semiconductor device modeling; Watches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing (ISSM), 2008 International Symposium on
Conference_Location :
Tokyo, Japan
ISSN :
1523-553X
Electronic_ISBN :
1523-553X
Type :
conf
Filename :
5714920
Link To Document :
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