DocumentCode
539417
Title
Monitoring and managing system of equipment operation status by using detailed event log data extracted from exposure tool
Author
Ikeda, Masatoshi ; Nishimura, Hidetaka ; Takahashi, Ichiro ; Ibe, Yukio
Author_Institution
Semiconductor Leading Edge Technologies Co. Ltd., 1-3-3 Uchi-kanda, Chiyoda-ku, Tokyo, Japan
fYear
2008
fDate
27-29 Oct. 2008
Firstpage
181
Lastpage
184
Abstract
In order to keep semiconductor manufacturing equipment operating stably, visualizing the basic operating status of the tools is an essential aspect of control. With the latest tools equipped with an EES (Equipment Engineering System), effective monitoring has been demonstrated through implementation of EEQA and EEQM to visualize basic operations of the tools. In this report, we explain the effectiveness of applying EES to earlier versions of exposure tools. By collecting the same data used by the latest equipment, we were able to visualize basic operations using EES through the same method employed on the latest equipment.
Keywords
Calibration; Data visualization; Local area networks; Manufacturing; Monitoring; Production facilities; Time frequency analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing (ISSM), 2008 International Symposium on
Conference_Location
Tokyo, Japan
ISSN
1523-553X
Electronic_ISBN
1523-553X
Type
conf
Filename
5714938
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