• DocumentCode
    539417
  • Title

    Monitoring and managing system of equipment operation status by using detailed event log data extracted from exposure tool

  • Author

    Ikeda, Masatoshi ; Nishimura, Hidetaka ; Takahashi, Ichiro ; Ibe, Yukio

  • Author_Institution
    Semiconductor Leading Edge Technologies Co. Ltd., 1-3-3 Uchi-kanda, Chiyoda-ku, Tokyo, Japan
  • fYear
    2008
  • fDate
    27-29 Oct. 2008
  • Firstpage
    181
  • Lastpage
    184
  • Abstract
    In order to keep semiconductor manufacturing equipment operating stably, visualizing the basic operating status of the tools is an essential aspect of control. With the latest tools equipped with an EES (Equipment Engineering System), effective monitoring has been demonstrated through implementation of EEQA and EEQM to visualize basic operations of the tools. In this report, we explain the effectiveness of applying EES to earlier versions of exposure tools. By collecting the same data used by the latest equipment, we were able to visualize basic operations using EES through the same method employed on the latest equipment.
  • Keywords
    Calibration; Data visualization; Local area networks; Manufacturing; Monitoring; Production facilities; Time frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing (ISSM), 2008 International Symposium on
  • Conference_Location
    Tokyo, Japan
  • ISSN
    1523-553X
  • Electronic_ISBN
    1523-553X
  • Type

    conf

  • Filename
    5714938