DocumentCode
539419
Title
High reliable characteristics in manufacturing of MEMS Pressure Sensor
Author
Zushi, Tetsuhiro ; Inaba, Yoshinori ; Sato, Ai ; Asai, Makoto
Author_Institution
OMRON Corporation, 568 Matsuo Minakuchi-cho Koka-shi Shiga prefecture, 528-0074, Japan
fYear
2008
fDate
27-29 Oct. 2008
Firstpage
327
Lastpage
330
Abstract
In order to achieve the high reliable characteristics of Capacitive Pressure Sensor, we have improved MEMS (Micro Electro Mechanical Systems) process in manufacturing which are constructed with the technology of micromachining process for Si substrate and the technology of anodic bonding process for Si diaphragm and fixed electrode glass. As the process conditions and the pattern design of a passivation SiO2 on metal electrode of the sensor have been optimized while preventing sticking failures in MEMS manufacturing, the solutions for elimination of Capacitance Drift failure of the sensor in humidity stress test has been proposed.
Keywords
Electrodes; Humidity; Micromechanical devices; Passivation; Silicon; Sputtering; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing (ISSM), 2008 International Symposium on
Conference_Location
Tokyo, Japan
ISSN
1523-553X
Electronic_ISBN
1523-553X
Type
conf
Filename
5714940
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