• DocumentCode
    539419
  • Title

    High reliable characteristics in manufacturing of MEMS Pressure Sensor

  • Author

    Zushi, Tetsuhiro ; Inaba, Yoshinori ; Sato, Ai ; Asai, Makoto

  • Author_Institution
    OMRON Corporation, 568 Matsuo Minakuchi-cho Koka-shi Shiga prefecture, 528-0074, Japan
  • fYear
    2008
  • fDate
    27-29 Oct. 2008
  • Firstpage
    327
  • Lastpage
    330
  • Abstract
    In order to achieve the high reliable characteristics of Capacitive Pressure Sensor, we have improved MEMS (Micro Electro Mechanical Systems) process in manufacturing which are constructed with the technology of micromachining process for Si substrate and the technology of anodic bonding process for Si diaphragm and fixed electrode glass. As the process conditions and the pattern design of a passivation SiO2 on metal electrode of the sensor have been optimized while preventing sticking failures in MEMS manufacturing, the solutions for elimination of Capacitance Drift failure of the sensor in humidity stress test has been proposed.
  • Keywords
    Electrodes; Humidity; Micromechanical devices; Passivation; Silicon; Sputtering; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing (ISSM), 2008 International Symposium on
  • Conference_Location
    Tokyo, Japan
  • ISSN
    1523-553X
  • Electronic_ISBN
    1523-553X
  • Type

    conf

  • Filename
    5714940