• DocumentCode
    540271
  • Title

    PAMTRAK: a system to monitor high value objects and personnel in restricted areas

  • Author

    Anspach, D.A. ; Anspach, J.P. ; Walters, B.G. ; Crain, B., Jr.

  • fYear
    1996
  • fDate
    2-4 Oct. 1996
  • Firstpage
    129
  • Lastpage
    134
  • Abstract
    The United States Department of Energy (DOE) uses sensitive or classified parts and material that must be protected and accounted for. We believe there is a need for an automated system that can help protect and monitor these parts and material. In response to this need, Sandia National Laboratories (SNL) has developed a real time personnel and material tracking system called PAMTRAK that has been installed at selected DOE facilities. PAMTRAK safeguards sensitive parts and material by tracking tags worn by personnel and by monitoring sensors attached to the parts or material. The paper describes our goals when designing PAMTRAK, the PAMTRAK system components, our current installations, and the benefits a site can expect when using PAMTRAK. So far PAMTRAK has been installed exclusively at government facilities; however, it is also applicable to private industries that need to protect high value assets. Through government programs such as CRADAs, SBIRs, and other mechanisms, the DOE often works with private industry to promote further development and commercialization of national laboratory developed technologies. SNL supports and welcomes partners and new users of PAMTRAK
  • Keywords
    computerised monitoring; personnel; real-time systems; telecommunication computing; tracking; CRADAs; DOE facilities; PAMTRAK; SBIRs; United States Department of Energy; automated system; high value object monitoring; material tracking system; monitoring sensors; personnel monitoring; private industry; real time personnel tracking system; restricted areas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Security Technology, 1996. 30th Annual 1996 International Carnahan Conference
  • Conference_Location
    Lexington, Kentucky, USA
  • Print_ISBN
    0-7803-3537-6
  • Type

    conf

  • DOI
    10.1109/CCST.1996.551853
  • Filename
    5726993