Title :
Method for characterizing dual-layer materials using a free space technique
Author :
Osman, N.H. ; Free, C.E.
Author_Institution :
Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
Abstract :
In this paper, a new development of the method for characterizing dual layer dielectric materials using a free space technique is discussed. Mixing theory is applied to estimate the permittivity and loss tangent of the material, and a correction factor is added to improve the accuracy of the results. Measured data on the permittivity and loss tangent value of several materials between 145 GHz and 180 GHz are presented.
Keywords :
dielectric losses; dielectric materials; permittivity; correction factor; dual layer dielectric material; free space technique; loss tangent; mixing theory; permittivity estimation; Decision support systems; Material characterization; effective permittivity; free space measurement; mixing formula;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2
