Title :
Multiport VNAs measurements and their digital applications
Author_Institution :
Electron. Dept., Politec. di Torino, Torino, Italy
Abstract :
The characterization of modern digital devices, from the processor to the motherboard poses serious challenges to the engineers due to the microwave frequencies involved. In this paper a survey of today multiport vector network analyzer used to measured digital components will be present. The paper will span from the instrument architectures to the calibration techniques and their applications to PC components measurements at microwave frequencies.
Keywords :
calibration; microprocessor chips; network analysers; PC components measurement; calibration technique; digital device application; instrument architecture; microwave frequency; motherboard; multiport VNA measurement; multiport vector network analyzer; processor; Calibration; Frequency measurement; Mathematical model; Microwave devices; Microwave measurements; Sockets;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2
