Title :
Evaluation of a multi-line de-embedding technique for millimeter-wave CMOS circuit design
Author :
Bu, Qing-Hong ; Li, Ning ; Bunsen, Keigo ; Asada, Hiroki ; Matsushita, Kota ; Okada, Kenichi ; Matsuzawa, Akira
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
This paper presents the evaluation of a pad model which is made by using L-2L de-embedding method. The coplanar waveguide transmission line (CPWTL) is used to evaluate the de-embedding method. The pad circuit model is set up after obtaining the results of de-embedding. Two comparisons are carried out to accomplish the evaluation of the pad circuit model. The calculation error in quality factor of transmission line is less than 6% in experimental result. Employing the model to de-embed other DUTs, the process becomes simple and chip area can be saved.
Keywords :
CMOS integrated circuits; integrated circuit design; millimetre wave integrated circuits; L-2L deembedding method; chip area; coplanar waveguide transmission line; millimeter-wave CMOS circuit design; multiline deembedding technique; pad circuit model; pad model; quality factor; Equivalent circuits; Impedance; Integrated circuit modeling; Power transmission lines; Q factor; Semiconductor device modeling; Transmission line measurements; L-2L; de-embedding; millimeter wave; transmission line;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2
