DocumentCode :
540478
Title :
High-frequency half-integral subharmonic locked ring-VCO-based scalable PLL in 90 nm CMOS
Author :
Lee, Sang-yeop ; Amakawa, Shuhei ; Ishihara, Noboru ; Masu, Kazuya
Author_Institution :
Solution Sci. Res. Lab., Tokyo Inst. of Technol., Yokohama, Japan
fYear :
2010
fDate :
7-10 Dec. 2010
Firstpage :
586
Lastpage :
589
Abstract :
A wide-frequency-range ring-VCO-based PLL with half-integral subharmonic locking was realized (PLL area: 0.11mm2) by adopting 90nm CMOS technology. The proposed circuit is configured with two cascaded PLLs; one of them is a reference PLL (frequency tuning range: 1.2-2.4 GHz) that generates reference signals to the other one from low-frequency external reference signals. The other is a main PLL (frequency tuning range: 6.1-10.4 GHz) that generates high-frequency output signals. A high-frequency half-integral subharmonic locking technique was used to decrease the phase noise characteristics. For a 46MHz input reference signal, the 1-MHz-offset phase noise of the PLL was -89 dBc/Hz without injection locking (PLL output frequency: 6.62 GHz = 4.5 × 32 × 46 MHz); with half-integral subharmonic locking at the same output frequency, the 1-MHz-offset phase noise was -99 dBc/Hz (power consumption from a 1.0V power supply: 23 mW).
Keywords :
CMOS integrated circuits; low-power electronics; phase locked loops; phase noise; voltage-controlled oscillators; CMOS; cascaded PLL; frequency 1 MHz; frequency 1.2 GHz to 2.4 GHz; frequency 46 MHz; frequency 6.1 GHz to 10.4 GHz; frequency 6.62 GHz; high-frequency half-integral subharmonic locking technique; phase noise characteristics; power 23 mW; size 90 nm; voltage 1 V; wide-frequency-range ring-VCO; CMOS integrated circuits; Injection-locked oscillators; Jitter; Phase locked loops; Phase noise; Tuning; Voltage-controlled oscillators; CMOS integrated circuits; Phase-locked loops; injection locked oscillators; phase noise; ring VCO;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2
Type :
conf
Filename :
5728359
Link To Document :
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