Title :
On-wafer noise figure measurements of millimeter-wave LNA and mixer
Author :
Chang, Yin-Cheng ; Lin, Shuw-Guann ; Chiou, Hwann-Kaeo ; Chang, Da-Chiang ; Juang, Ying-Zong
Author_Institution :
Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
Abstract :
An on-wafer measurement technique is performed to characterize the noise figure (NF) at millimeter-wave (MMW) band. Two NF-measurement techniques are reviewed, and the Y-factor method is discussed in detail. The measurement principles and considerations are proposed for the device under test (DUT) at MMW band. The test procedure and setups are performed to measure the V-band amplifier and mixer. The experimental results confirm the validity with high accuracy by comparing with the simulations.
Keywords :
built-in self test; circuit testing; low noise amplifiers; millimetre wave amplifiers; millimetre wave mixers; noise measurement; MMW band; NF-measurement; V-band amplifier; Y-factor method; device under test; low noise amplifier; millimeter-wave LNA; millimeter-wave band; mixer; on-wafer noise figure measurement; Frequency measurement; Gain; Loss measurement; Mixers; Noise; Noise measurement; Testing; low noise amplifiers; millimeter wave measurements; mixers; noise figure;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2
