Title :
A systematic measurement technique to characterize bimodal oscillation for CMOS Quadrature LC-VCO
Author :
Shin, Shih-Chieh ; Hsiao, Sen-Wen ; Poh, John Chung-Hang ; Laskar, Joy
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents a theoretical analysis and control procedure of the bimodal oscillation phenomenon inherent to LC-tuned Quadrature voltage-controlled oscillators (QVCOs). A systematic start-up procedure is proposed to drive the quadrature VCO (QVCO) into the desirable mode of operation by controlling its initial conditions. This is the first reported approach in the published literature to the best of author´s knowledge. The theory and the proposed methodology are validated with the measurement of a 13-GHz QVCO implemented in 90 nm CMOS using NMOS current-coupling topology.
Keywords :
CMOS analogue integrated circuits; MMIC oscillators; circuit oscillations; field effect MMIC; voltage-controlled oscillators; CMOS quadrature LC-VCO; LC-tuned quadrature voltage-controlled oscillators; NMOS current-coupling topology; bimodal oscillation phenomenon; frequency 13 GHz; size 90 nm; systematic measurement technique; systematic start-up procedure; CMOS integrated circuits; MOS devices; Resonant frequency; Solid state circuits; Varactors; Voltage-controlled oscillators; 90-nm CMOS; Bimodal oscillation; phase ambiguity; quadrature phase generation; voltage-controlled oscillator (VCO);
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2