DocumentCode :
540757
Title :
Gm-boosted balanced Colpitts compared to conventional balanced Colpitts and cross-coupled VCOs in InGaP HBT technology
Author :
Lai, Szhau ; Kuylenstierna, Dan ; Angelov, Iltcho ; Hansson, Bertil ; Kozhuharov, Rumen ; Zirath, Herbert
Author_Institution :
Microwave Electron. Lab., Chalmers Univ. of Technol., Gothenburg, Sweden
fYear :
2010
fDate :
7-10 Dec. 2010
Firstpage :
386
Lastpage :
389
Abstract :
This paper presents a very compact (800×600μm2) gm-boosted balanced Colpitts VCO in a customized InGaP HBT process. An excellent phase noise of -112 dBc/Hz@100kHz off-set and tuning range over 10% centers around 6GHz carrier is reached. To the authors best knowledge, this is the first ever gm-boosted balanced Colpitts in InGaP HBT. It is validated that the topology may provide enhanced performance compared to both conventional balanced Colpitts and cross-coupled topologies that are also evaluated in this work. The gm-boosted balanced Colpitts is found to be slightly better than the balanced Colpitts and significantly better than the cross-coupled topology. Particularly, the gm-boosted topology benefits from less variation in phase noise and output power over the tuning range. For all three circuits the phase noise is well predicted using an in-house large-signal noise HBT model. The intrinsic device wave-forms are verified with a large-signal vector network analyzer. It is found that the level of phase noise as well as the simulation accuracy is highly correlated to the wave-forms in the VCO.
Keywords :
gallium compounds; heterojunction bipolar transistors; indium compounds; network analysers; phase noise; voltage-controlled oscillators; InGaP; conventional balanced Colpitts; cross-coupled VCO; cross-coupled topology; gm-boosted balanced Colpitts; in-house large-signal noise HBT model; intrinsic device wave-form; large-signal vector network analyzer; phase noise; Heterojunction bipolar transistors; Integrated circuit modeling; Load modeling; Phase noise; Topology; Voltage-controlled oscillators; HBT; InGaP; VCO; compact device models; large-signal modeling; phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2
Type :
conf
Filename :
5728640
Link To Document :
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