Title :
Direct bonded aluminum on aluminum nitride substrates via a transient liquid phase and its application
Author :
Kuromitsu, Yoshirou ; Nagatomo, Yoshiyuki ; Tonomura, Hiroshi ; Akiyama, Kazuhiro ; Montesa, Christine Marie ; Shibata, Naoya ; Ikuhara, Yuichi
Author_Institution :
Central Res. Inst., Mitsubishi Mater. Corp., Naka, Japan
Abstract :
A new bonding process has been developed for producing direct bonded aluminum (DBA) substrates using aluminum nitride (AlN). A transient eutectic liquid phase forms in aluminum-X (X = silicon, germanium, silver, or copper) systems at the interface between the aluminum foil and the AlN substrate. The aluminum-X liquid phase transiently contacts the AlN substrate prior to isothermal solidification by diffusion of the element X into the aluminum foil. We prepared DBA substrates using this process and demonstrated that they are highly stable after thermal cycling testing. Furthermore, we used this method to simultaneously bond and fabricate DBA substrates with an aluminum-alloy base plate. We confirmed that this new process for fabricating DBA substrates with an aluminum-alloy base plate has the potential to be cost-effective and to be applied to produce high-reliability, high-power modules used under conditions of severe thermal stress.
Keywords :
III-V semiconductors; aluminium; copper; diffusion; diffusion bonding; elemental semiconductors; finite element analysis; germanium; reliability; silicon; silver; solidification; wide band gap semiconductors; Al-Ag-AlN; Al-Cu-AlN; Al-Ge-AlN; Al-Si-AlN; AlN; aluminum foil; aluminum nitride substrates; aluminum-alloy base plate; bonding process; diffusion; direct bonded aluminum; direct bonded aluminum substrates; finite element analysis; isothermal solidification; thermal cycling testing; transient eutectic liquid phase; transient liquid phase; Adhesives; Aluminum; Copper; Finite element methods; Heating; Silicon; Substrates;
Conference_Titel :
Integrated Power Electronics Systems (CIPS), 2010 6th International Conference on
Conference_Location :
Nuremberg
Print_ISBN :
978-1-61284-814-3