DocumentCode
54353
Title
High-Aspect-Ratio Through Silicon Vias for High-Frequency Application Fabricated by Magnetic Assembly of Gold-Coated Nickel Wires
Author
Bleiker, Simon J. ; Fischer, Andreas C. ; Shah, Umer ; Somjit, Nutapong ; Haraldsson, Tommy ; Roxhed, Niclas ; Oberhammer, Joachim ; Stemme, Goran ; Niklaus, Frank
Author_Institution
Micro & Nanosyst., KTH R. Inst. of Technol., Stockholm, Sweden
Volume
5
Issue
1
fYear
2015
fDate
Jan. 2015
Firstpage
21
Lastpage
27
Abstract
In this paper, we demonstrate a novel manufacturing technology for high-aspect-ratio vertical interconnects for high-frequency applications. This novel approach is based on magnetic self-assembly of prefabricated nickel wires that are subsequently insulated with a thermosetting polymer. The highfrequency performance of the through silicon vias (TSVs) is enhanced by depositing a gold layer on the outer surface of the nickel wires and by reducing capacitive parasitics through a low-k polymer liner. As compared with conventional TSV designs, this novel concept offers a more compact design and a simpler, potentially more cost-effective manufacturing process. Moreover, this fabrication concept is very versatile and adaptable to many different applications, such as interposer, micro electromechanical systems, or millimeter wave applications. For evaluation purposes, coplanar waveguides with incorporated TSV interconnections were fabricated and characterized. The experimental results reveal a high bandwidth from dc to 86 GHz and an insertion loss of <;0.53 dB per single TSV interconnection for frequencies up to 75 GHz.
Keywords
gold; integrated circuit interconnections; nickel; self-assembly; three-dimensional integrated circuits; wafer-scale integration; wires (electric); Au; Ni; capacitive parasitics; coplanar waveguides; gold layer; gold-coated nickel wires; high-aspect-ratio through silicon vias; high-aspect-ratio vertical interconnects; high-frequency application; interposer; low-k polymer liner; magnetic self-assembly; micro electromechanical systems; millimeter wave applications; prefabricated nickel wires; thermosetting polymer; Fabrication; Gold; Insertion loss; Nickel; Substrates; Through-silicon vias; Wires; RF signal transmission; skin effect; through silicon via (TSV); vertical interconnection; wafer scale integration; wafer scale integration.;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2014.2369236
Filename
6965577
Link To Document