DocumentCode :
544124
Title :
Phase error corrections for Microstrip 8×8 Butler Matrix used in 7 Tesla MRI
Author :
Yazdanbakhsh, Pedram ; Solbach, Klaus
Author_Institution :
Hochfrequenztech., Univ. Duisburg-Essen, Duisburg, Germany
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper describes a method to determine fixed phase shifters of the Microstrip 8×8 Butler Matrix, realized in one substrate board, which is designed and fabricated for our 7-Tesla Magnetic Resonance Imaging (MRI) system. This method is based on a global optimization problem to minimize a cost function including a variety of 64 functions as a function of the fixed phase shifts of the 8×8 Butler Matrix. Finally, after optimizing this cost function, estimating the phase shifts and finding the phase error of each fixed phase shifter, the phase error corrections are realized using three different methods: shorting bends (filling), adding open-circuited stubs to the lines (shunt capacitance) and cutting small areas of lines (series capacitance).
Keywords :
error correction; magnetic resonance imaging; microstrip lines; microstrip resonators; microwave phase shifters; 7-Tesla magnetic resonance imaging; global optimization problem; microstrip butler matrix; open-circuited stubs; phase error corrections; phase shifters; series capacitance; shorting bends; shunt capacitance; substrate board; Butler matrix; Couplers; Equations; Error correction; Magnetic resonance imaging; Microstrip; Phase shifters; Butler Matrix; Genetic Algorithm; MRI; Optimization; Phase Error Corrections;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (GeMIC), 2011 German
Conference_Location :
Darmstadt
Print_ISBN :
978-1-4244-9225-1
Electronic_ISBN :
978-3-9812668-3-2
Type :
conf
Filename :
5760730
Link To Document :
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