DocumentCode :
544166
Title :
Custom-made calibration standards for measurements of multilayer substrates
Author :
Kotzev, Miroslav ; Schuster, Christian
Author_Institution :
Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
4
Abstract :
In this paper the authors present custom-made calibration standards for microprobe based measurements on multilayer printed circuit boards. Non ideal short, open and load (SOL) terminations are positioned at the end of through holes (vias). The combination of via plus termination forms a custom-made standard for printed circuit board measurements. The load standard consists of a soldered 47 Ohm (SMD, 0402, 1%) resistor, a solder bridge is used as a short and for the open the via is left open. The usable bandwidth of the standards is studied with the help of a two-tier calibration method. Comparisons of measurements performed on the same device under test using either the microprobe vendor calibration substrate or the custom-made standards show good correlation in the frequency bandwidth from 10 MHz up to 30 GHz.
Keywords :
calibration; printed circuit design; resistors; custom-made calibration standard; frequency 10 GHz to 30 GHz; microprobe based measurement; multilayer printed circuit board; multilayer substrate; resistor; solder bridge; two-tier calibration method; Bandwidth; Calibration; Nonhomogeneous media; Printed circuits; Probes; Standards; Substrates; Two-tier calibration; calibration standards; microprobes; multilayer printed circuit boards; vector network analyzer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (GeMIC), 2011 German
Conference_Location :
Darmstadt
Print_ISBN :
978-1-4244-9225-1
Electronic_ISBN :
978-3-9812668-3-2
Type :
conf
Filename :
5760793
Link To Document :
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