Title :
An analytical method for correcting images obtained with Scanning Tunneling Microscopes
Author :
Bonfiglio, Annalisa ; Bianco, Bruno ; Cambiaso, Andrea ; Elementi, Luciano ; Ricci, Davide
Author_Institution :
Dept. of Biophys. & Electron. Eng., Univ. of Genoa, Genoa, Italy
fDate :
Oct. 29 1992-Nov. 1 1992
Abstract :
An analytical method for the correction of images obtained through Scanning Tunneling Microscopy (STM) is presented. The method is based on the analysis of the Discrete Fourier Transform (DFT) of the experimental STM images. A transformation matrix in the Fourier plane is derived from the comparison of the DFT of the experimental images with the DFT of the ideal STM image; this transformation is then applied to correct the experimental images. This kind of procedure is shown to be suitable also for the evaluation of repeatability of the instrument performance.
Keywords :
discrete Fourier transforms; image processing; physics computing; scanning tunnelling microscopy; Fourier plane; STM; discrete Fourier transform; image correction; scanning tunneling microscopes; transformation matrix; Atmospheric measurements; Distortion measurement; Particle measurements; Rotation measurement;
Conference_Titel :
Engineering in Medicine and Biology Society, 1992 14th Annual International Conference of the IEEE
Conference_Location :
Paris
Print_ISBN :
0-7803-0785-2
Electronic_ISBN :
0-7803-0816-6
DOI :
10.1109/IEMBS.1992.5760890
