An analytical method for correcting images obtained with Scanning Tunneling Microscopes

Author

Bonfiglio, Annalisa ; Bianco, Bruno ; Cambiaso, Andrea ; Elementi, Luciano ; Ricci, Davide

Author_Institution

Dept. of Biophys. & Electron. Eng., Univ. of Genoa, Genoa, Italy

Volume

1

fYear

1992

fDate

Oct. 29 1992-Nov. 1 1992

Firstpage

129

Lastpage

130

Abstract

An analytical method for the correction of images obtained through Scanning Tunneling Microscopy (STM) is presented. The method is based on the analysis of the Discrete Fourier Transform (DFT) of the experimental STM images. A transformation matrix in the Fourier plane is derived from the comparison of the DFT of the experimental images with the DFT of the ideal STM image; this transformation is then applied to correct the experimental images. This kind of procedure is shown to be suitable also for the evaluation of repeatability of the instrument performance.

Keywords

discrete Fourier transforms; image processing; physics computing; scanning tunnelling microscopy; Fourier plane; STM; discrete Fourier transform; image correction; scanning tunneling microscopes; transformation matrix; Atmospheric measurements; Distortion measurement; Particle measurements; Rotation measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society, 1992 14th Annual International Conference of the IEEE

Conference_Location

Paris

Print_ISBN

0-7803-0785-2

Electronic_ISBN

0-7803-0816-6

Type

conf

DOI

10.1109/IEMBS.1992.5760890

Filename

5760890